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: IPBizPhantom reference used to back up phantom theory
By Lawrence B. Ebert, Esq.
In the x-ray diffraction of carbonaceous materials, there is no logical reason to assume an interrelation between the intensity of the (002) peak, reflecting intermolecular "stacking" order of aromatic planes, and the fractional aromaticity fa measured by carbon nuclear magnetic resonance.
Believe it or not, someone who argued that x-ray diffraction WAS a good way to measure fractional aromaticity (within the ACS journal, Energy & Fuels) cited to a non-existent reference. The editor was so-informed, but did nothing.
Full post as published by IPBiz on February 10, 2008 (boomark / email).
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