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USPTO Adopts New Measure of Patent Examination Quality

By Donald Zuhn, Kevin Noonan, Chris Singer, Sherri Oslick, and Jason Derry

By Donald Zuhn -- Last week, the U.S. Patent and Trademark Office announced that it was adopting new, more comprehensive procedures for measuring the quality of patent examination. The new procedures were developed by a joint USPTO-Patent Public Advisory Committee (PPAC) Task Force following consultation with the patent community and public. Under the new system, seven aspects of the examination process will be assessed to yield a composite quality metric. The seven aspects include two patent examination quality measures used previously -- the final rejection and allowance compliance rate (the correctness of the examiners' overall determination of the patentability of...

Full post as published by Patent Docs on October 14, 2010 (boomark / email).